Mitigating BTI-Induced Degradation in STT-MRAM Sensing Schemes

Ing-Chao Lin, Yun Kae Law, Yuan Xie. Mitigating BTI-Induced Degradation in STT-MRAM Sensing Schemes. IEEE Trans. VLSI Syst., 26(1):50-62, 2018. [doi]

Abstract

Abstract is missing.