MIX: A Test Generation System for Synchronous Sequential Circuits

Xijiang Lin, Irith Pomeranz, Sudhakar M. Reddy. MIX: A Test Generation System for Synchronous Sequential Circuits. In 11th International Conference on VLSI Design (VLSI Design 1991), 4-7 January 1998, Chennai, India. pages 456-463, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.