ω (the weakest t-norm) fuzzy GERT for evaluating uncertain process reliability in semiconductor manufacturing

Kuo-Ping Lin, Ming-Jia Wu, Kuo-Chen Hung, Yiyo Kuo. ω (the weakest t-norm) fuzzy GERT for evaluating uncertain process reliability in semiconductor manufacturing. Appl. Soft Comput., 11(8):5165-5180, 2011. [doi]

Abstract

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