Joint sizing and adaptive independent gate control for FinFET circuits operating in multiple voltage regimes using the logical effort method

Xue Lin, Yanzhi Wang, Massoud Pedram. Joint sizing and adaptive independent gate control for FinFET circuits operating in multiple voltage regimes using the logical effort method. In Jörg Henkel, editor, The IEEE/ACM International Conference on Computer-Aided Design, ICCAD'13, San Jose, CA, USA, November 18-21, 2013. pages 444-449, IEEE/ACM, 2013. [doi]

Abstract

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