Scott Lindell, Gary Shapiro, Kenneth Weil, David Flannery, Jeffrey Levy, Wei Qian. Development of Mammogram Computer-Aided Diagnosis Systems Using Optical Processing Technology. In 29th Applied Image Pattern Recognition Workshop (AIPR 2000), 16-18 October 2000, Washington, DC, USA, Proceedings. pages 173-179, IEEE Computer Society, 2000. [doi]
Abstract is missing.