Barry P. Linder, E. Cartier, S. Krishnan, E. Wu. Improving and optimizing reliability in future technologies with high-κ dielectrics. In 2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013. pages 1-4, IEEE, 2013. [doi]
Abstract is missing.