Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults

Walter M. Lindermeir, Thomas J. Vogels, Helmut E. Graeb. Analog Test Design with IDD Measurements for the Detection of Parametric and Catastrophic Faults. In 1998 Design, Automation and Test in Europe (DATE 98), February 23-26, 1998, Le Palais des Congrès de Paris, Paris, France. pages 822, IEEE Computer Society, 1998. [doi]

Abstract

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