Improving the Performance of Automatic Sequential Test Generation by Targeting Hard-to-Test Faults - researchr publication

researchr

You are not signed in
Sign in
Sign up

Loganathan Lingappan, Niraj K. Jha. Improving the Performance of Automatic Sequential Test Generation by Targeting Hard-to-Test Faults. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 431-436, IEEE Computer Society, 2006. [doi]

Abstract is missing.

runs on WebDSL