BEAM: A Computational Workflow System for Managing and Modeling Material Characterization Data in HPC Environments

Eric J. Lingerfelt, A. Belianinov, E. Endeve, O. Ovchinnikov, S. Somnath, J. Borreguero, N. Grodowitz, B. Park, R. K. Archibald, C. T. Symons, S. V. Kalinin, O. E. Bronson Messer, M. Shankar, S. Jesse. BEAM: A Computational Workflow System for Managing and Modeling Material Characterization Data in HPC Environments. In Michelle Connolly, editor, International Conference on Computational Science 2016, ICCS 2016, 6-8 June 2016, San Diego, California, USA. Volume 80 of Procedia Computer Science, pages 2276-2280, Elsevier, 2016. [doi]

Abstract

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