Lionel Vincent, Philippe Maurine, Suzanne Lesecq, Edith Beigné. Embedding statistical tests for on-chip dynamic voltage and temperature monitoring. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 994-999, ACM, 2012. [doi]
Abstract is missing.