Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams. Enhancing test efficiency for delay fault testing using multiple-clocked schemes. In Proceedings of the 39th Design Automation Conference, DAC 2002, New Orleans, LA, USA, June 10-14, 2002. pages 371-374, ACM, 2002. [doi]
Abstract is missing.