Vladimir G. Litvinov, Nikolay V. Vishnyakov, Valery V. Gudzev, Vladislav G. Mishustin, Sergey M. Karabanov, Sergey P. Vikhrov, Andrey S. Karabanov. Measuring complex for analysis of recombination deep traps in semiconductor solar cells. In IEEE International Conference on Industrial Technology, ICIT 2015, Seville, Spain, March 17-19, 2015. pages 1071-1074, IEEE, 2015. [doi]
Abstract is missing.