Kaikai Liu, Hao Cai, Ting An, Lirida A. B. Naviner, Jean-François Naviner, Hervé Petit. Reliability analysis of combinational circuits with the influences of noise and single-event transients. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 218-223, IEEE, 2013. [doi]
Abstract is missing.