Xiaoyan Liu, Wangyong Chen, Linlin Cai, Gang Du, Xing Zhang. Self-heating Induced Variability and Reliability in Advanced Logic Devices and Circuits. In 13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.