Fast chip aging prediction by product-like VMIN drift characterization on test structures

S. E. Liu, G. Y. Chen, M. K. Chen, David. Yen, W. A. Kuo, C. S. Fu, Y. S. Tsai, M. Z. Lin, Y. H. Fang, M. J. Lin. Fast chip aging prediction by product-like VMIN drift characterization on test structures. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 3, IEEE, 2018. [doi]

Abstract

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