Chunsheng Liu, Krishnendu Chakrabarty, Michael Gössel. An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 382-386, IEEE Computer Society, 2002. [doi]
Abstract is missing.