Tong Liu, Xiao-Tao Chen, Fabrizio Lombardi, José Salinas. Layout-driven detection of bridge faults in interconnects. In 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996. pages 105-113, IEEE Computer Society, 1996. [doi]
Abstract is missing.