Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing

Xiaoqiang Liu, Li Cai, Baojun Liu, Xiaokuo Yang, Huanqing Cui, Cheng Li. Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing. IEEE Access, 7:51276-51283, 2019. [doi]

Abstract

Abstract is missing.