Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST

Chunsheng Liu, Kumar N. Dwarakanath, Krishnendu Chakrabarty, Ronald D. Blanton. Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST. In 2004 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2004), Emerging Trends in VLSI Systems Design, 19-20 February 2004, Lafayette, LA, USA. pages 173-178, IEEE Computer Society, 2004. [doi]

Abstract

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