Yongpan Liu, Robert P. Dick, Li Shang, Huazhong Yang. Accurate temperature-dependent integrated circuit leakage power estimation is easy. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1526-1531, ACM, 2007. [doi]
Abstract is missing.