Wei Liu, Yaru Ding, Liang Zhao, Yi Zhao. Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-5, IEEE, 2021. [doi]
Abstract is missing.