Cheng Liu, Jingjing Gu, Zujia Yan, Fuzhen Zhuang, Yunyun Wang. SDC-causing Error Detection Based on Lightweight Vulnerability Prediction. In Wee Sun Lee, Taiji Suzuki, editors, Proceedings of The 11th Asian Conference on Machine Learning, ACML 2019, 17-19 November 2019, Nagoya, Japan. Volume 101 of Proceedings of Machine Learning Research, pages 1049-1064, PMLR, 2019. [doi]
Abstract is missing.