Yan Liu, Pei-yun Hseuh, Rick Lawrence, Steve Meliksetian, Claudia Perlich, Alejandro Veen. Latent graphical models for quantifying and predicting patent quality. In Chid Apté, Joydeep Ghosh, Padhraic Smyth, editors, Proceedings of the 17th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, San Diego, CA, USA, August 21-24, 2011. pages 1145-1153, ACM, 2011. [doi]
@inproceedings{LiuHLMPV11,
title = {Latent graphical models for quantifying and predicting patent quality},
author = {Yan Liu and Pei-yun Hseuh and Rick Lawrence and Steve Meliksetian and Claudia Perlich and Alejandro Veen},
year = {2011},
doi = {10.1145/2020408.2020586},
url = {http://doi.acm.org/10.1145/2020408.2020586},
researchr = {https://researchr.org/publication/LiuHLMPV11},
cites = {0},
citedby = {0},
pages = {1145-1153},
booktitle = {Proceedings of the 17th ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, San Diego, CA, USA, August 21-24, 2011},
editor = {Chid Apté and Joydeep Ghosh and Padhraic Smyth},
publisher = {ACM},
isbn = {978-1-4503-0813-7},
}