Qingrui Liu, Joseph Izraelevitz, Se Kwon Lee, Michael L. Scott, Sam H. Noh, Changhee Jung. iDO: Compiler-Directed Failure Atomicity for Nonvolatile Memory. In 51st Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2018, Fukuoka, Japan, October 20-24, 2018. pages 258-270, IEEE, 2018. [doi]
Abstract is missing.