Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning

Zhenbao Liu, Zhen Jia, Chi-Man Vong, Shuhui Bu, Junwei Han, Xiaojun Tang. Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning. IEEE Trans. Industrial Informatics, 13(3):1213-1226, 2017. [doi]

Abstract

Abstract is missing.