Yanli Liu, Dongxu Lu, Liangchen Deng, Tianyuan Bai, Kai Hou, Yuan Zeng. Risk assessment for the cascading failure of electric cyber-physical system considering multiple information factors. IET Cyper-Phys. Syst.: Theory & Appl., 2(4):155-160, 2017. [doi]
@article{LiuLDBHZ17,
title = {Risk assessment for the cascading failure of electric cyber-physical system considering multiple information factors},
author = {Yanli Liu and Dongxu Lu and Liangchen Deng and Tianyuan Bai and Kai Hou and Yuan Zeng},
year = {2017},
url = {http://ieeexplore.ieee.org/document/8221716/},
researchr = {https://researchr.org/publication/LiuLDBHZ17},
cites = {0},
citedby = {0},
journal = {IET Cyper-Phys. Syst.: Theory & Appl.},
volume = {2},
number = {4},
pages = {155-160},
}