Power supply current detectability of SRAM defects

Jian Liu, Rafic Z. Makki. Power supply current detectability of SRAM defects. In 4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India. pages 367, IEEE Computer Society, 1995. [doi]

Authors

Jian Liu

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Rafic Z. Makki

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