Lili Liu, Graziella Pettinati, Ching Y. Suen. Computer-Aided Wartegg Drawing Completion Test. In Yue Lu, Nicole Vincent, Pong Chi Yuen, Wei-Shi Zheng, Farida Cheriet, Ching Y. Suen, editors, Pattern Recognition and Artificial Intelligence - International Conference, ICPRAI 2020, Zhongshan, China, October 19-23, 2020, Proceedings. Volume 12068 of Lecture Notes in Computer Science, pages 575-580, Springer, 2020. [doi]
Abstract is missing.