Shaobo Liu, Qinru Qiu, Qing Wu. A probabilistic technique for full-chip leakage estimation. In Vijaykrishnan Narayanan, C. P. Ravikumar, Jörg Henkel, Ali Keshavarzi, Vojin G. Oklobdzija, Barry M. Pangrle, editors, Proceedings of the 2008 International Symposium on Low Power Electronics and Design, 2008, Bangalore, India, August 11-13, 2008. pages 205-208, ACM, 2008. [doi]
Abstract is missing.