An Analysis of Boosted Linear Classifiers on Noisy Data with Applications to Multiple-Instance Learning

Rui Liu, Soumya Ray. An Analysis of Boosted Linear Classifiers on Noisy Data with Applications to Multiple-Instance Learning. In Vijay Raghavan, Srinivas Aluru, George Karypis, Lucio Miele, Xindong Wu, editors, 2017 IEEE International Conference on Data Mining, ICDM 2017, New Orleans, LA, USA, November 18-21, 2017. pages 287-296, IEEE Computer Society, 2017. [doi]

Abstract

Abstract is missing.