Changze Liu, Hyun-Chul Sagong, Hyejin Kim, Seungjin Choo, HyunWoo Lee, Yoohwan Kim, Hyunjin Kim, Bisung Jo, Minjung Jin, Jinjoo Kim, Sangsu Ha, Sangwoo Pae, Jongwoo Park. Systematical study of 14nm FinFET reliability: From device level stress to product HTOL. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]
Abstract is missing.