Weihua Liu, Fei Wu 0005, Songmiao Meng, Xiang Chen, Changsheng Xie. Error Generation for 3D NAND Flash Memory. In Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu, editors, 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022. pages 56-59, IEEE, 2022. [doi]
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