Leakage power reduction by dual-vth designs under probabilistic analysis of vth variation

Michael Liu, Wei-Shen Wang, Michael Orshansky. Leakage power reduction by dual-vth designs under probabilistic analysis of vth variation. In Rajiv V. Joshi, Kiyoung Choi, Vivek Tiwari, Kaushik Roy, editors, Proceedings of the 2004 International Symposium on Low Power Electronics and Design, 2004, Newport Beach, California, USA, August 9-11, 2004. pages 2-7, ACM, 2004. [doi]

Abstract

Abstract is missing.