Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory

Peng Liu 0045, Zhiqiang You, Jigang Wu, Michael Elimu, Weizheng Wang, Shuo Cai, Yinhe Han. Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory. IEEE Trans. Emerging Topics Comput., 9(2):745-758, 2021. [doi]

Abstract

Abstract is missing.