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Peng Liu 0045, Zhiqiang You, Jigang Wu, Michael Elimu, Weizheng Wang, Shuo Cai, Yinhe Han. Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory. IEEE Trans. Emerging Topics Comput., 9(2):745-758, 2021. [doi]
Abstract is missing.