An Abnormal Negative Temperature Dependence of Erasestate Vt Retention Shift in 3-D NAND Flash Memories

Y. H. Liu, Y.-S. Yang, T. C. Zhan, M. Hu, Z. J. Liu, W. Lin, A.-C. Liu, Y. C. Hsu. An Abnormal Negative Temperature Dependence of Erasestate Vt Retention Shift in 3-D NAND Flash Memories. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 30-1, IEEE, 2022. [doi]

Abstract

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