Analysis of SET Reconvergence and Hardening in the Combinational Circuit Using a SAT-Based Method

Chang Liu 0019, Long Zhang 0004, Xu He, Yang Guo. Analysis of SET Reconvergence and Hardening in the Combinational Circuit Using a SAT-Based Method. IEEE Access, 6:48740-48746, 2018. [doi]

Abstract

Abstract is missing.