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Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory

R. Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, G. Haller, Vincent Pouget, Dean Lewis. Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. Microelectronics Reliability, 51(9-11):1658-1661, 2011. [doi]

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R. Llido

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J. Gomez

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Vincent Goubier

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N. Froidevaux

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L. Dufayard

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G. Haller

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Vincent Pouget

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Dean Lewis

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