Tachen Leo Lo. Sensitivity Analysis of System Changes Under a Production Environment. In David Morley, Jason G. Shane, Sue Felix, Bernard Domanski, John Boelens, Gordon R. Stauffer, Roberta S. Terkowitz, Tom Scoumperdis, H. Pat Artis, editors, 13th International Computer Measurement Group Conference, Orlando, FL, USA, December 7-11, 1987, Proceedings. pages 446-451, Computer Measurement Group, 1987.
Abstract is missing.