A ReRAM Macro Using Dynamic Trip-Point-Mismatch Sampling Current-Mode Sense Amplifier and Low-DC Voltage-Mode Write-Termination Scheme Against Resistance and Write-Delay Variation

Chieh-Pu Lo, Wen-Zhang Lin, Wei-Yu Lin, Huan-Ting Lin, Tzu-Hsien Yang, Yen-Ning Chiang, Ya-Chin King, Chrong Jung Lin, Yu-Der Chih, Tsung-Yung Jonathon Chang, Meng-Fan Chang. A ReRAM Macro Using Dynamic Trip-Point-Mismatch Sampling Current-Mode Sense Amplifier and Low-DC Voltage-Mode Write-Termination Scheme Against Resistance and Write-Delay Variation. J. Solid-State Circuits, 54(2):584-595, 2019. [doi]

Abstract

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