J. Locati, Vincenzo Della Marca, C. Rivero, Arnaud Régnier, Stephan Niel, K. Coulie. AC stress reliability study of a new high voltage transistor for logic memory circuits. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.