Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Woong-Kee Loh, Ju Young Yun. A parallel algorithm for robust fault detection in semiconductor manufacturing processes. Cluster Computing, 17(3):643-651, 2014. [doi]
Abstract is missing.