Degradation processes modelled with Dynamic Bayesian Networks

Anselm Lorenzoni, Michael Kempf. Degradation processes modelled with Dynamic Bayesian Networks. In 13th IEEE International Conference on Industrial Informatics, INDIN 2015, Cambridge, United Kingdom, July 22-24, 2015. pages 1694-1699, IEEE, 2015. [doi]

Abstract

Abstract is missing.