Lower confidence limits for process capability indices C::p:: and C::pk:: when data are autocorrelated

Cynthia R. Lovelace, James J. Swain, Hisham Zeinelabdin, Jatinder N. D. Gupta. Lower confidence limits for process capability indices C::p:: and C::pk:: when data are autocorrelated. Quality and Reliability Eng. Int., 25(6):663-700, 2009. [doi]

Abstract

Abstract is missing.