Li Lu, Scott T. Block, David E. Duarte, Changzhi Li. A 0.45-V MOSFETs-Based Temperature Sensor Front-End in 90 nm CMOS With a Noncalibrated $\pm \hbox{3.5} \ ^{\circ}\hbox{C} \ \hbox{3}\sigma$ Relative Inaccuracy From $-\hbox{55} \ ^{\circ}\hbox{C}$ to 105 $^{\circ}\hbox{C}$. IEEE Trans. on Circuits and Systems, 60-II(11):771-775, 2013. [doi]
@article{LuBDL13,
title = {A 0.45-V MOSFETs-Based Temperature Sensor Front-End in 90 nm CMOS With a Noncalibrated $\pm \hbox{3.5} \ ^{\circ}\hbox{C} \ \hbox{3}\sigma$ Relative Inaccuracy From $-\hbox{55} \ ^{\circ}\hbox{C}$ to 105 $^{\circ}\hbox{C}$},
author = {Li Lu and Scott T. Block and David E. Duarte and Changzhi Li},
year = {2013},
doi = {10.1109/TCSII.2013.2281746},
url = {http://dx.doi.org/10.1109/TCSII.2013.2281746},
researchr = {https://researchr.org/publication/LuBDL13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {60-II},
number = {11},
pages = {771-775},
}