Characterization, simulation, and modeling of FET source/drain diffusion resistance

Ning Lu, Bill Dewey. Characterization, simulation, and modeling of FET source/drain diffusion resistance. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 281-284, IEEE, 2008. [doi]

Abstract

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