Shyue-Kung Lu, Shih-Chang Huang. Built-in Self-Test and Repair (BISTR) Techniques for Embedded RAMs. In 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA. pages 60-64, IEEE Computer Society, 2004. [doi]
Abstract is missing.