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Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang. A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design. J. Electronic Testing, 38(1):63-76, 2022. [doi]
Abstract is missing.