Shyue-Kung Lu, Hao-Wei Lin, Masaki Hashizume. An enhanced built-in self-repair technique for yield and reliability improvement of embedded memories. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.