Shan Lu, Soyeon Park, Eunsoo Seo, Yuanyuan Zhou. Learning from mistakes: a comprehensive study on real world concurrency bug characteristics. In Susan J. Eggers, James R. Larus, editors, Proceedings of the 13th International Conference on Architectural Support for Programming Languages and Operating Systems, ASPLOS 2008, Seattle, WA, USA, March 1-5, 2008. pages 329-339, ACM, 2008. [doi]
Abstract is missing.