Chih-Wen Lu, Chauchin Su, Chung-Len Lee, Jwu E. Chen. Is IDDQ testing not applicable for deep submicron VLSI in year 2011?. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 338-343, IEEE Computer Society, 2000. [doi]
Abstract is missing.